Semitransparent cathodes for organic light emitting devices

Journal of Applied Physics

Volumn 87, Issue 6, 2000, Pages 3080-3085

  Burrows, P E ^a   Gu, G ^a   Forrest, S R ^a   Vicenzi, E P ^a   Zhou, T X ^b  

^a Princeton University   (United States)

^b UNIVERSAL DISPLAY CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000491876     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372303     Document Type: Article

References (28)

1. V. Bulovic, G. Gu, P. E. Burrows, M. E. Thompson, and S. R. Forrest, Nature (London) 380, 29 (1996).
2. G. Gu, V. Bulovic, P. E. Burrows, S. R. Forrest, and M. E. Thompson, Appl. Phys. Lett. 68, 2606 (1996).
3. P. E. Burrows, G. Gu, Z. Shen, V. Bulovic, S. R. Forrest, and M. E. Thompson, IEEE Trans. Electron Devices 44, 1188 (1997).
4. Z. Shen, P. E. Burrows, V. Bulovic, S. R. Forrest, and M. E. Thompson, Science 276, 2009 (1997).
5. P. F. Tian, V. Bulovic, P. E. Burrows, G. Gu, S. R. Forrest, and T. X. Zhou, J. Vac. Sci. Technol. A 17, 2975 (1999).
6. G. Gu, G. Parthasarathy, P. E. Burrows, P. Tian, and S. R. Forrest, J. Appl. Phys. 86, 4076 (1999).
7. G. Gu, G. Parthasarathy, P. E. Burrows, P. Tian, I. G. Hill, A. Kahn, and S. R. Forrest, J. Appl. Phys. 86, 4067 (1999).
8. G. Gu and S. R. Forrest, IEEE J. Sel. Top. Quantum Electron. 4, 83 (1998).
9. C. C. Wu, C. I. Wu, J. C. Sturm, and A. Kahn, Appl. Phys. Lett. 70, 1348 (1997).
10. C. W. Tang, S. A. VanSlyke, and C. H. Chen, J. Appl. Phys. 65, 3610 (1989).
11. J. Kido and Y. Iizumi, Appl. Phys. Lett. 73, 2721 (1998).
12. S. T. Lee, X. Y. Hou, M. G. Mason, and C. W. Tang, Appl. Phys. Lett. 72, 1593 (1998).
13. A. Rajagopal and A. Kahn, J. Appl. Phys. 84, 355 (1998).
14. A. K. Kulkarni, T. Lim, M. Khan, and K. H. Schultz, J. Vac. Sci. Technol. A 16, 1636 (1998).
15. K. Utsumi, O. Matsunaga, and T. Takahata, Thin Solid Films 334, 30 (1998).
16. H. Kobayashi, T. Ishida, K. Nakamura, Y. Nakato, and H. Tsubomura, J. Appl. Phys. 72, 5288 (1992).
17. W-F. Wu and B-S. Chiou, Semicond. Sci. Technol. 11, 196 (1996).
18. S. Honda, A. Tsujimoto, M. Watamori, and K. Oura, J. Vac. Sci. Technol. A 13, 1100 (1995).
19. J. C. C. Fan and J. B. Goodenough, J. Appl. Phys. 48, 3524 (1977).
20. E. S. Laux, N. Kaiser, A. Zöller, R. Gotzelmann, H. Lauth, and H. Bernitzki, Thin Solid Films 335, 1 (1998).
21. 2; 10:1 by mass, giving atomic ratios In:Sn=10.86 and In:0=0.59.
22. Applied Films Corp., Boulder, CO.
23. P. E. Burrows, V. Bulovic, S. R. Forrest, L. S. Sapochak, D. M. McCarty, and M. E. Thompson, Appl. Phys. Lett. 65, 2922 (1994).
24. S. A. Van Slyke, C. H. Chen, and C. W. Tang, Appl. Phys. Lett. 69, 2160 (1997).
25. G. Pathasarathy, P. E. Burrows, V. Khalfin, V. G. Kozolov, and S. R. Forrest, Appl. Phys. Lett. 72, 2138 (1998).
26. L. S. Hung, C. W. Tang, and M. G. Mason, Appl. Phys. Lett. 70, 152 (1997).
27. G. E. Jabbour, Y. Kawabe, S. E. Shaheen, M. M. Morrell, B. Kippelen, and N. Peyghambarian, Appl. Phys. Lett. 71, 1762 (1997).
28. L. S. Hung and C. W. Tang, Appl. Phys. Lett. 74, 3209 (1999).