A metal-free cathode for organic semiconductor devices

Applied Physics Letters

Volumn 72, Issue 17, 1998, Pages 2138-2140

  Parthasarathy, G ^a   Burrows, P E ^a   Khalfin, V ^a   Kozlov, V G ^a   Forrest, S R ^a  

^a Princeton University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0342410492     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121301     Document Type: Article

References (16)

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13. Values for the ionization energies (defined as the vacuum level to the highest occupied molecular orbital distance) are from A. Rajagopal, C. I. Wu, and A. Kahn, J. Appl. Phys. 83, 2649 (1998), and
14. K. Seki, Mol. Cryst. Liq. Cryst. 171, 255 (1989). While these authors suggest that the vacuum level may not be flat between organic heterojunctions, as shown in Fig. 4, this does not change our conclusions, and hence, has been omitted for simplicity.
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16. Yield is defined as the ratio of the nonshorted, efficient devices to the total number of devices tested. Device populations numbered from 10 to 20.