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Volumn 78, Issue 2, 2001, Pages 156-158

Deformation behavior of ion-beam-modified GaN

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000224157     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1335552     Document Type: Article
Times cited : (52)

References (17)
  • 17
    • 0348120635 scopus 로고    scopus 로고
    • note
    • Slightly nonconstant behavior tor E of ion-damaged GaN with increasing penetration depth [see Fig. 3(b)] may be attributed to a nonuniform distribution of implantation disorder and/or to the substrate effect.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.