-
1
-
-
0005985130
-
-
and references therein
-
See, for example, a recent review S. J. Pearton, J. C. Zolper, R. J. Shul, and F. Ren, J. Appl. Phys. 86, 1 (1999), and references therein.
-
(1999)
J. Appl. Phys.
, vol.86
, pp. 1
-
-
Pearton, S.J.1
Zolper, J.C.2
Shul, R.J.3
Ren, F.4
-
2
-
-
0001714792
-
-
M. D. Drory, J. W. Ager III, T. Suski, I. Grzegory, and S. Porowski, Appl. Phys. Lett. 69, 4044 (1996).
-
(1996)
Appl. Phys. Lett.
, vol.69
, pp. 4044
-
-
Drory, M.D.1
Ager J.W. III2
Suski, T.3
Grzegory, I.4
Porowski, S.5
-
3
-
-
0032092386
-
-
G. Yu, H. Ishikawa, T. Egawa, T. Soga, J. Watanabe, T. Jimbo, and M. Umeno, J. Cryst. Growth 189/190, 701 (1998).
-
(1998)
J. Cryst. Growth
, vol.189-190
, pp. 701
-
-
Yu, G.1
Ishikawa, H.2
Egawa, T.3
Soga, T.4
Watanabe, J.5
Jimbo, T.6
Umeno, M.7
-
5
-
-
0032606633
-
-
R. Nowak, M. Pessa, M. Suganuma, M. Leszczynski, I. Grzegory, S. Porowski, and F. Yoshida, Appl. Phys. Lett. 75, 2070 (1999).
-
(1999)
Appl. Phys. Lett.
, vol.75
, pp. 2070
-
-
Nowak, R.1
Pessa, M.2
Suganuma, M.3
Leszczynski, M.4
Grzegory, I.5
Porowski, S.6
Yoshida, F.7
-
6
-
-
0037658394
-
-
D. Cáceres, I. Vergara, R. González, E. Monroy, F. Calle, E. Muñoz, and F. Omnés, J. Appl. Phys. 86, 6773 (1999).
-
(1999)
J. Appl. Phys.
, vol.86
, pp. 6773
-
-
Cáceres, D.1
Vergara, I.2
González, R.3
Monroy, E.4
Calle, F.5
Muñoz, E.6
Omnés, F.7
-
7
-
-
0033350425
-
-
M. H. Hong, A. V. Samant, V. Orlov, B. Farber, C. Kisielowski, and P. Pirouz, Mater. Res. Soc. Symp. Proc. 572, 369 (1999); M. H. Hong, P. Pirouz, P. M. Tavernier, and D. R. Clarke, ibid. 622 (in press).
-
(1999)
Mater. Res. Soc. Symp. Proc.
, vol.572
, pp. 369
-
-
Hong, M.H.1
Samant, A.V.2
Orlov, V.3
Farber, B.4
Kisielowski, C.5
Pirouz, P.6
-
8
-
-
0033350425
-
-
in press
-
M. H. Hong, A. V. Samant, V. Orlov, B. Farber, C. Kisielowski, and P. Pirouz, Mater. Res. Soc. Symp. Proc. 572, 369 (1999); M. H. Hong, P. Pirouz, P. M. Tavernier, and D. R. Clarke, ibid. 622 (in press).
-
Mater. Res. Soc. Symp. Proc.
, vol.622
-
-
Hong, M.H.1
Pirouz, P.2
Tavernier, P.M.3
Clarke, D.R.4
-
9
-
-
0001492071
-
-
S. O. Kucheyev, J. E. Bradby, J. S. Williams, C. Jagadish, M. Toth, M. R. Phillips, and M. V. Swain, Appl. Phys. Lett. 77, 3373 (2000).
-
(2000)
Appl. Phys. Lett.
, vol.77
, pp. 3373
-
-
Kucheyev, S.O.1
Bradby, J.E.2
Williams, J.S.3
Jagadish, C.4
Toth, M.5
Phillips, M.R.6
Swain, M.V.7
-
10
-
-
0034664589
-
-
S. O. Kucheyev, J. S. Williams, C. Jagadish, J. Zou, and G. Li, Phys. Rev. B 62, 7510 (2000); S. O. Kucheyev, J. S. Williams, J. Zou, C. Jagadish, and G. Li, Nucl. Instrum. Methods Phys. Res. B (in press).
-
(2000)
Phys. Rev. B
, vol.62
, pp. 7510
-
-
Kucheyev, S.O.1
Williams, J.S.2
Jagadish, C.3
Zou, J.4
Li, G.5
-
11
-
-
0034664589
-
-
in press
-
S. O. Kucheyev, J. S. Williams, C. Jagadish, J. Zou, and G. Li, Phys. Rev. B 62, 7510 (2000); S. O. Kucheyev, J. S. Williams, J. Zou, C. Jagadish, and G. Li, Nucl. Instrum. Methods Phys. Res. B (in press).
-
Nucl. Instrum. Methods Phys. Res. B
-
-
Kucheyev, S.O.1
Williams, J.S.2
Zou, J.3
Jagadish, C.4
Li, G.5
-
12
-
-
0032662725
-
-
J. S. Williams, Y. Chen, J. Wong-Leung, A. Kerr, and M. V. Swain, J. Mater. Res. 14, 2338 (1999).
-
(1999)
J. Mater. Res.
, vol.14
, pp. 2338
-
-
Williams, J.S.1
Chen, Y.2
Wong-Leung, J.3
Kerr, A.4
Swain, M.V.5
-
13
-
-
0000817470
-
-
S. O. Kucheyev, J. S. Williams, C. Jagadish, J. Zou, V. S. J. Craig, and G. Li, Appl. Phys. Lett. 77, 1455 (2000).
-
(2000)
Appl. Phys. Lett.
, vol.77
, pp. 1455
-
-
Kucheyev, S.O.1
Williams, J.S.2
Jagadish, C.3
Zou, J.4
Craig, V.S.J.5
Li, G.6
-
16
-
-
0040118509
-
-
R. Nowak, C. L. Li, and M. V. Swain, Mater. Sci. Eng., A 253, 167 (1998).
-
(1998)
Mater. Sci. Eng., A
, vol.253
, pp. 167
-
-
Nowak, R.1
Li, C.L.2
Swain, M.V.3
-
17
-
-
0348120635
-
-
note
-
Slightly nonconstant behavior tor E of ion-damaged GaN with increasing penetration depth [see Fig. 3(b)] may be attributed to a nonuniform distribution of implantation disorder and/or to the substrate effect.
-
-
-
|