High temperature hardness of bulk single crystal GaN

Materials Research Society Symposium - Proceedings

Volumn 595, Issue , 2000, Pages

  Yonenaga, I ^a   Hoshi, T ^b   Usui, A ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b NEC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33751325662     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (10)

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