Size control of carbon-induced Ge quantum dots

Applied Physics Letters

Volumn 77, Issue 20, 2000, Pages 3218-3220

  Beyer, A ^a   Muller E ^a   Sigg, H ^a   Stutz, S ^a   Grutzmacher D ^a   Leifeld, O ^b   Ensslin, K ^c  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b EPFL   (Switzerland)

^c ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000063968     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1326033     Document Type: Article

References (13)

1. O. G. Schmidt, C. Lange, K. Eberl, O. Kienzle, and F. Ernst, Appl. Phys. Lett. 71, 2340 (1997).
2. S. Schieker, O. G. Schmidt, K. Eberl, N. Y. Jin-Phillipp, and F. Phillipp, Appl. Phys. Lett. 72, 3344 (1998).
3. O. Leifeld, D. Grützmacher, B. Müller, K. Kern, E. Kaxiras, and P. C. Kelires, Phys. Rev. Lett. 82, 972 (1999).
4. O. Leifeld, A. Beyer, E. Müller, K. Kern, and D. Grützmacher, Mater. Sci. Eng., B 74, 222 (2000).
5. Y. W. Mo, D. E. Savage, B. S. Swartzentruber, and M. G. Lagally, Phys. Rev. Lett. 65, 1020 (1990).
6. N. N. Ledentsov, M. Grundmann, N. Kirstaeder et al. Solid-State Electron. 40, 785 (1996).
7. D. J. Bottomley, Appl. Phys. Lett. 72, 783 (1998).
8. R. Butz and H. Lüth, Thin Solid Films 336, 69 (1998).
9. R. Hartmann, V. Gennser, H. Sigg, D. Grützmacher, and K. Ensslin, Appl. Phys. Lett. 73, 1257 (1998).
10. R. Hartmann, D. Grützmaeher, E. Mueller, U. Gennser, A. Dommann, P. Schroeter, and P. Warren, Thin Solid Films 318, 158 (1998).
11. A. Kurtenbach, C. Ulrich, N. Y. Jin-Phillipp, F. Noll, K. Eberl, K. Syassen, and F. Phillipp, J. Electron. Mater. 25, 395 (1996).
12. C. Guedj (private communication).
13. O. G. Schmidt, C. Lange, K. Eberl, O. Kienzle, and F. Ernst, Thin Solid Films 321, 70 (1998).