Kelvin probe force microscopy as a tool for characterizing chemical sensors

Applied Physics Letters

Volumn 85, Issue 17, 2004, Pages 3926-3928

  Grover, R ^a   McCarthy, B ^a   Zhao, Y ^a   Jabbour, G E ^a   Sarid, D ^a   Laws, G M ^b   Takulapalli, B R ^b   Thornton, T J ^b   Gust, D ^b  

^a UNIVERSITY OF ARIZONA   (United States)

^b ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT POTENTIAL DIFFERENCE (CPD); KELVIN PROBE FORCE MICROSCOPY; PORPHYRIN LAYERS; TEMPORAL EVOLUTION;

ATOMIC FORCE MICROSCOPY; ELECTRODES; MICROSCOPIC EXAMINATION; MONOLAYERS; NATURAL FREQUENCIES; SENSITIVITY ANALYSIS; SILICON WAFERS;

CHEMICAL SENSORS;

EID: 9744284974     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1810209     Document Type: Article

References (18)

1. T. E. Edmonds (Chapman & Hall, New York, 1998).
2. L. A. Pinnaduwage, V. Boiadjiev, J. E. Hawk, and T. Thundat, Appl. Phys. Lett. 83, 1471 (2003).
3. P. Bergveld, J. Hendrikse, and W. Olthuis, Meas. Sci. Technol. 9, 1801 (1998).
4. G. M. Laws, T. J. Thornton, Y. Jinman, L. de-la Garza, M. Kozicki, D. Gust, J. Gu, and D. Sarid, Physica E (Amsterdam) 17, 659 (2003).
5. G. M. Laws, T. J. Thornton, Y. Jinman, L. de-la Garza, M. Kozicki, and D. Gust, Phys. Status Solidi B 233, 83 (2002).
6. Y. Jinman, L. de-la Garza, T. J. Thornton, M. Kozicki, and D. Gust, J. Vac. Sci. Technol. B 20, 1706 (2002).
7. D. M. Taylor, H. Morgan, and C. D'Silva, J. Phys. D 24, 1443 (1991).
8. E. Moons, A. Goossens, and T. Savenije, J. Phys. Chem. B 101, 8492 (1997).
9. A. d'Amico, C. di Natale, R. Paolesse, A. Mantini, C. Goletti, F. Davide, and G. Filosofi, Sens. Actuators B 70, 254 (2000).
10. D. C. Hansen, K. M. Hansen, T. L. Ferrell, and T. Thundat, Langmuir 19, 7514 (2003).
11. M. Nonnenmacher, M. P. O'Boyle, and H. K. Wickramasinghe, Appl. Phys. Lett. 58, 2921 (1991).
12. J. M. R. Weaver and D. W. Abraham, J. Vac. Sci. Technol. B 9, 1559 (1991).
13. A. K. Henning, T. Hochwitz, J. Slinkman, J. Never, S. Hoffman, P. Kaszuba, and C. Daghlian, J. Appl. Phys. 77, 1888 (1995).
14. H. O. Jacobs, P. Leuchtmann, O. J. Homan, and A. Stemmer, J. Appl. Phys. 84, 1168 (1998).
15. H. O. Jacobs, H. F. Knapp, and A. Stemmer, Rev. Sci. Instrum. 70, 1756 (1999).
16. S. Kitamura and M. Iwatsuki, Appl. Phys. Lett. 72, 3154 (1998).
17. C. Di-Natale, R. Paolesse, A. Mantini, A. Macagnano, T. Boschi, and A. D'Amico, Sens. Actuators B 48, 368 (1998).
18. C. Di-Natale, C. Goletti, R. Paolesse, M. Drago, A. Macagnano, A. Mantini, V. I. Troitsky, T. S. Berzina, M. Cocco, and A. D'Amico, Sens. Actuators B 57, 183 (1999).