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Volumn 48, Issue 1-3, 1998, Pages 368-372

Kelvin prove investigation of self-assembled-monolayers of thiol derivatized porphyrins interacting with volatile compounds

Author keywords

Kelvin probe; Self assembled monolayers; Thiol derivatized porphyrins

Indexed keywords


EID: 0346498163     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-4005(98)00072-0     Document Type: Article
Times cited : (3)

References (4)
  • 1
    • 0005233162 scopus 로고    scopus 로고
    • Fermi level determination in organic thin films by the Kelvin probe method
    • M. Pfeiffer, K. Leo, N. Karl, Fermi level determination in organic thin films by the Kelvin probe method, J. Appl. Phys. 80 (1996) 6880-6883.
    • (1996) J. Appl. Phys. , vol.80 , pp. 6880-6883
    • Pfeiffer, M.1    Leo, K.2    Karl, N.3
  • 4
    • 0032040784 scopus 로고    scopus 로고
    • Self assembled monolayer of mercaptoporphyrins as sensing materials for quartz microbalance chemical sensors
    • R. Paolesse, C. Di Natale, A. Macagnano, F. Davide, T. Boschi, A. D'Amico, Self assembled monolayer of mercaptoporphyrins as sensing materials for quartz microbalance chemical sensors, Sens. Actuators B, 47 (1998) 70-76.
    • (1998) Sens. Actuators B , vol.47 , pp. 70-76
    • Paolesse, R.1    Di Natale, C.2    Macagnano, A.3    Davide, F.4    Boschi, T.5    D'Amico, A.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.