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Volumn 57, Issue 1-3, 1999, Pages 183-187

Kelvin probe investigation of the thickness effects in Langmuir-Blodgett films of pyrrolic macrocycles sensitive to volatile compounds in gas phase

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; CHEMICAL SENSORS; DEPOSITION; ELECTRONIC STRUCTURE; MOLECULES; MONOLAYERS; ORGANIC COMPOUNDS;

EID: 0033533289     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-4005(99)00143-4     Document Type: Article
Times cited : (13)

References (9)
  • 1
    • 0005233162 scopus 로고    scopus 로고
    • Fermi level determination in organic thin films by the Kelvin probe method
    • Pfeiffer M., Leo K., Karl N. Fermi level determination in organic thin films by the Kelvin probe method. J. Appl. Physics. 80:1996;6880-6883.
    • (1996) J. Appl. Physics , vol.80 , pp. 6880-6883
    • Pfeiffer, M.1    Leo, K.2    Karl, N.3
  • 6
    • 0032158214 scopus 로고    scopus 로고
    • Characterization and design of porphyrins-based broad selectivity chemical sensors for electronic nose applications
    • Di Natale C., Paolesse R., Macagnano A., Mantini A., Goletti C., D'Amico A. Characterization and design of porphyrins-based broad selectivity chemical sensors for electronic nose applications. Sensors and Actuators B. 52:1998;162-168.
    • (1998) Sensors and Actuators B , vol.52 , pp. 162-168
    • Di Natale, C.1    Paolesse, R.2    Macagnano, A.3    Mantini, A.4    Goletti, C.5    D'Amico, A.6
  • 9
    • 0031250036 scopus 로고    scopus 로고
    • Surface photovoltage of porphyrin layers using the Kelvin probe technique
    • Moons E., Goossens A., Savenije T. Surface photovoltage of porphyrin layers using the Kelvin probe technique. J. Phys. Chem. B. 101:1997;8492.
    • (1997) J. Phys. Chem. B , vol.101 , pp. 8492
    • Moons, E.1    Goossens, A.2    Savenije, T.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.