Scaled topometry in a multisensor approach

Optical Engineering

Volumn 43, Issue 10, 2004, Pages 2469-2477

  Kayser, Daniel ^a   Bothe, Thorsten ^a   Osten, Wolfgang ^b  

^a BIAS BREMER INSTITUT FÜR ANGEWANDTE STRAHLTECHNIK GMBH   (Germany)

^b UNIVERSITY OF STUTTGART   (Germany)

Author keywords

Active detection; Discrimination algorithm; Multisensor system; Scaled topometry; Surface inspection

Indexed keywords

ALGORITHMS; IMAGE QUALITY; INSPECTION; OPTICAL VARIABLES MEASUREMENT; QUALITY CONTROL; SENSOR DATA FUSION; SURFACE STRUCTURE;

ACTIVE DETECTION; DISCRIMINATION ALGORITHM; SCALED TOPOMETRY; SURFACE INSPECTION;

OPTICAL SENSORS;

EID: 9744270783     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1788690     Document Type: Article

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