One-grating projection for absolute three-dimensional profiling

Optical Engineering

Volumn 40, Issue 8, 2001, Pages 1653-1660

  Korner K ^a   Windecker, R ^a   Fleischer, M ^a   Tiziani, H J ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

Author keywords

Gratings; Profiling; Projection

Indexed keywords

DIFFRACTION GRATINGS; INTERFEROMETRY; MICROSCOPIC EXAMINATION; PHASE MODULATION;

THREE-DIMENSIONAL PROFILING;

PROFILOMETRY;

EID: 0035414761     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1385509     Document Type: Article

References (19)

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