An integrated measurement system for the inspection of extended surfaces in industrial quality control

VDI Berichte

Volumn , Issue 1694, 2002, Pages 339-344

  Kayser, D ^a   Bothe, Th ^a   Osten, W ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ADAPTABLE SENSORS; HIGH RESOLUTION; INDUSTRIAL QUALITY CONTROL; SURFACE INSPECTION;

ALGORITHMS; AUTOMATION; DATA ACQUISITION; DECOMPOSITION; DEMODULATION; FRACTALS; INSPECTION; QUALITY CONTROL; TOPOLOGY;

WAVELET TRANSFORMS;

EID: 4444356984     PISSN: 00835560     EISSN: None     Source Type: Book Series    
DOI: None     Document Type: Conference Paper

References (15)

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2. Osten, W.; Andrä, P.; Kayser, D.: Highly-resolved Measurement of Extended Technical Surfaces with Scalable Topometry. TM 66(1999)11, 411 -428
3. Kayser, D.; Osten, W.; Jüptner, W.: A Scale independent Algorithm for the Detection of Fault indicating Structures in Range Images. In: Jacquot, P.; Fournier, J.-M. (Eds.): Interferometry in Speckle Light: Theory and Applications, Springer-Verlag, 2000, 389-396
4. th International Workshop on Automatic Processing of Fringe Patterns, Elsevier, Paris 2001, 427-434
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9. Keyence Corporation, Osaka, Japan: For more details see the homepage of the company at http://www.keyence.com
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11. Louis, A.; Maaß, P.; Rieder, A.: Wavelets. Teubner (2. Ed.), Stuttgart 1998
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