Fault detection in gray-value images of surfaces on different scales

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3744, Issue , 1999, Pages 110-117

  Kayser, D ^a   Bothe, Th ^a   Osten, W ^a  

^a Bremer Institut fuer Angewandte Strahltechnik   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; FOURIER TRANSFORMS; FRACTALS; OPTICAL FILTERS; OPTICAL VARIABLES MEASUREMENT; ROUGHNESS MEASUREMENT; WAVELET TRANSFORMS;

SCALED TOPOMETRY;

IMAGE ANALYSIS;

EID: 0032683359     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (19)