Zinc oxide nanodlsk

Applied Physics Letters

Volumn 85, Issue 17, 2004, Pages 3878-3880

  Xu, C X ^a   Sun, X W ^a   Dong, Z L ^b   Yu, M B ^c  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^c INSTITUTE OF MICROELECTRONICS   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; INTERFACIAL ENERGY; MELTING; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY; TRANSPORT PROPERTIES; X RAY DIFFRACTION;

DIFFRACTION PEAKS; ELECTRON BEAM IRRADIATIONS; MELTING POINTS; NANODISKS; VAPOR PHASE;

ZINC OXIDE;

EID: 9744256204     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1811380     Document Type: Article

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