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Volumn 15, Issue 11, 2004, Pages 1609-1612

Change from micrometre to nanometre size for diamond grains by plasma chemical vapour deposition

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON MICROSCOPY; MASS SPECTROMETERS; METHANE; NANOSTRUCTURED MATERIALS; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; POLYCRYSTALLINE MATERIALS; PYROMETERS; THERMOCOUPLES; X RAY DIFFRACTION ANALYSIS;

EID: 9744235139     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/15/11/040     Document Type: Article
Times cited : (5)

References (28)
  • 15
    • 0003459618 scopus 로고
    • San Francisco, CA: Freeman
    • Guinier A 1963 X-Ray Diffraction (San Francisco, CA: Freeman) p 121
    • (1963) X-ray Diffraction , pp. 121
    • Guinier, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.