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Volumn 14, Issue 21, 2004, Pages 3191-3197

Bismuth precursors for atomic layer deposition of bismuth-containing oxide films

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL STRUCTURE; FILM GROWTH; METALLIC FILMS; SURFACE REACTIONS; SYNTHESIS (CHEMICAL);

EID: 9144219795     PISSN: 09599428     EISSN: None     Source Type: Journal    
DOI: 10.1039/b405891g     Document Type: Conference Paper
Times cited : (77)

References (37)
  • 33
    • 0004150157 scopus 로고    scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, WI
    • G. M. Sheldrick, SHELXTL-Plus, Release 5.03, Siemens Analytical X-ray Instruments Inc., Madison, WI, 1994.
    • (1994) SHELXTL-Plus, Release 5.03
    • Sheldrick, G.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.