Model-Based Iterative Reconstruction for Bright-Field Electron Tomography

IEEE Transactions on Computational Imaging

Volumn 1, Issue 1, 2015, Pages 1-15

  Venkatakrishnan, S V ^a   Drummy, Lawrence F ^b   Jackson, Michael ^c   De Graef, Marc ^d   Simmons, Jeff ^b   Bouman, Charles A ^a  

^a PURDUE UNIVERSITY   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

^c BlueQuartz Software   (United States)

^d CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

bright field; electron microscopy.; Terms Model based reconstruction; tomography

Indexed keywords

COST FUNCTIONS; COSTS; CRYSTALLINE MATERIALS; ELECTRIC IMPEDANCE TOMOGRAPHY; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ITERATIVE METHODS; MEDICAL IMAGING; REPAIR;

BRIGHT-FIELDS; COST-FUNCTION; ELECTRON MICROSCOPY.; ELECTRON TOMOGRAPHY; FILTERED BACK-PROJECTION; LIFE-SCIENCES; MEASUREMENT ANOMALIES; MODEL BASED ITERATIVE RECONSTRUCTION; MODEL BASED RECONSTRUCTION; TERM-MODEL-BASED RECONSTRUCTION;

IMAGE RECONSTRUCTION;

EID: 85140806292     PISSN: 25730436     EISSN: 23339403     Source Type: Journal    
DOI: 10.1109/TCI.2014.2371751     Document Type: Article

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