A model based iterative reconstruction algorithm for High Angle Annular Dark Field-Scanning Transmission Electron Microscope (HAADF-STEM) Tomography

IEEE Transactions on Image Processing

Volumn 22, Issue 11, 2013, Pages 4532-4544

  Venkatakrishnan, S V ^a   Drummy, Lawrence F ^b   Jackson, Michael A ^c   De Graef, Marc ^d   Simmons, Jeff ^b   Bouman, Charles A ^a  

^a PURDUE UNIVERSITY   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

^c BlueQuartz Software   (United States)

^d CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

electron tomography; Model based iterative reconstruction (MBIR); transmission electron microscopy

Indexed keywords

ELECTRON TOMOGRAPHY; HIGH-ANGLE ANNULAR DARK FIELDS; ITERATIVE COORDINATE DESCENTS; MAXIMUM A POSTERIORI PROBABILITY ESTIMATIONS (MAP); MODEL BASED ITERATIVE RECONSTRUCTION; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SIMULTANEOUS ITERATIVE RECONSTRUCTION TECHNIQUES; TOMOGRAPHIC RECONSTRUCTION;

ALGORITHMS; ELECTRIC IMPEDANCE TOMOGRAPHY; PROBABILITY DISTRIBUTIONS; REPAIR; TRANSMISSION ELECTRON MICROSCOPY;

ITERATIVE METHODS;

ALGORITHM; ARTICLE; AUTOMATED PATTERN RECOGNITION; COMPUTER ASSISTED DIAGNOSIS; ELECTRON MICROSCOPY; IMAGE ENHANCEMENT; INFORMATION RETRIEVAL; METHODOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; THREE DIMENSIONAL IMAGING; TOMOGRAPHY; PROCEDURES;

ALGORITHMS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; IMAGING, THREE-DIMENSIONAL; INFORMATION STORAGE AND RETRIEVAL; MICROSCOPY, ELECTRON; PATTERN RECOGNITION, AUTOMATED; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; TOMOGRAPHY;

EID: 84884643690     PISSN: 10577149     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIP.2013.2277784     Document Type: Article

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