Bayesian tomography for projections with an arbitrary transmission function with an application in electron microscopy

Journal of Research of the National Institute of Standards and Technology

Volumn 111, Issue 6, 2006, Pages 411-417

  Levine, Zachary H ^a   Kearsley, Anthony J ^a   Hagedorn, John G ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Bayesian tomography; Beer's law; Maximum likelihood; Multiple scattering; Photonic band gap; Physical transmission function; Transmission electron microscope; Transmission thickness relation

Indexed keywords

BAND STRUCTURE; COMPUTER SIMULATION; IMAGE RECONSTRUCTION; STATISTICAL METHODS; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

BAYESIAN TOMOGRAPHY; BEER'S LAW; MAXIMUM LIKELIHOOD; MULTIPLE SCATTERING; PHOTONIC BAND GAPS; PHYSICAL TRANSMISSION FUNCTIONS; TRANSMISSION-THICKNESS RELATION;

PROJECTION SYSTEMS;

EID: 33845574388     PISSN: 1044677X     EISSN: None     Source Type: Journal    
DOI: 10.6028/jres.111.031     Document Type: Article

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