Full Chip Leakage Estimation Considering Power Supply and Temperature Variations

Proceedings of the International Symposium on Low Power Electronics and Design

Volumn , Issue , 2003, Pages 78-83

  Su, Haihua ^a   Liu, Frank ^a   Devgan, Anirudh ^a   Acar, Emrah ^a   Massif, Sani ^a  

^a IBM   (United States)

Author keywords

Leakage power; Supply voltage variation; Thermal analysis

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC BATTERIES; ELECTRIC POTENTIAL; ELECTRIC POWER DISTRIBUTION; INTEGRATED CIRCUIT LAYOUT; LEAKAGE CURRENTS; MATHEMATICAL MODELS; POLYNOMIALS; REGRESSION ANALYSIS; THERMOANALYSIS;

LEAKAGE POWER; SUPPLY VOLTAGE VARIATION;

ELECTRIC POWER SYSTEMS;

EID: 85088341156     PISSN: 15334678     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/871506.871529     Document Type: Conference Paper

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