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Volumn , Issue , 1998, Pages 738-743

Design and Analysis of Power Distribution Networks in PowerPCTM Microprocessors

Author keywords

Ir drop; Power distribution network; Powerpctm; Reliability

Indexed keywords

ELECTRIC NETWORK ANALYSIS; ELECTRIC POWER DISTRIBUTION; ELECTRIC POWER SYSTEMS; INTEGRATED CIRCUIT DESIGN; RELIABILITY; INTEGRATED CIRCUIT LAYOUT;

EID: 0031642709     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (157)

References (7)
  • 1
    • 0014630193 scopus 로고
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    • Black, J.R. Electromigration failure modes in aluminum metallization for semiconductor devices. Proc. IEEE, pp. 1587-1594, Sept 1969.
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    • Black, J.R.1
  • 2
    • 0025439702 scopus 로고
    • Estimation of maximum currents in mosic logic circuits
    • June
    • S. Chowdhry et al. Estimation of maximum currents in MOSIC logic circuits. IEEE Trans. CAD, pp. 642-654, June 1990.
    • (1990) IEEE Trans. CAD , pp. 642-654
    • Chowdhry, S.1
  • 3
    • 0029358733 scopus 로고
    • Pattern independent maximum current estimation in power and ground buses of CMOS VLSI circuits: Algorithms, signal correlations, and their resolution
    • Aug
    • H. Kriplani et al. Pattern independent maximum current estimation in power and ground buses of CMOS VLSI circuits: Algorithms, signal correlations, and their resolution. IEEE Trans. CAD, pp. 998-1012, Aug 1995.
    • (1995) IEEE Trans. CAD , pp. 998-1012
    • Kriplani, H.1
  • 4
    • 0030672649 scopus 로고    scopus 로고
    • Vector generation for maximum instantaneous current through supply lines for CMOS circuits
    • June
    • A. Krstic et al. Vector generation for maximum instantaneous current through supply lines for CMOS circuits. Proc. 34th DAC, pp. 383-388, June 1997.
    • (1997) Proc. 34th DAC , pp. 383-388
    • Krstic, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.