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Volumn , Issue , 2012, Pages 257-259

Non-hysteretic negative capacitance FET with Sub- 30mV/dec swing over 106X current range and ION of 0.3mA/μm without strain enhancement at 0.3V VDD

Author keywords

FeFET; Ferroelectric; NCFET; Negative capacitance

Indexed keywords

CAPACITANCE; HYSTERESIS;

EID: 85088044108     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (29)

References (9)
  • 1
    • 0036923304 scopus 로고    scopus 로고
    • I-MOS: A novelsemiconductor device with a subthreshold slope lower than kT/q
    • K. Gopalakrishnan, P. B. Griffin, and J. D. Plummer, "I-MOS: A novelsemiconductor device with a subthreshold slope lower than kT/q," in IEDM Tech. Dig., 2002, pp. 289-292.
    • (2002) IEDM Tech. Dig. , pp. 289-292
    • Gopalakrishnan, K.1    Griffin, P.B.2    Plummer, J.D.3
  • 3
    • 71049141790 scopus 로고    scopus 로고
    • Programming characteristics of the steep turn-on/off feedback FET (FBFET)
    • 16-18 June
    • Chun Wing Yeung, Padilla, A., Tsu-Jae King Liu, Chenming Hu, "Programming characteristics of the steep turn-on/off feedback FET (FBFET)," VLSI Technology, 2009 Symposium on, vol., no., pp.176-177, 16-18 June 2009.
    • (2009) VLSI Technology, 2009 Symposium on , pp. 176-177
    • Wing Yeung, C.1    Padilla, A.2    King Liu, T.3    Hu, C.4
  • 4
    • 40449116091 scopus 로고    scopus 로고
    • Use of negative capacitance to provide voltage amplification for low power nanoscale devices
    • S. Salahuddin and S. Datta, "Use of negative capacitance to provide voltage amplification for low power nanoscale devices," Nano Lett., vol. 8, no. 2, pp. 405-410, 2008.
    • (2008) Nano Lett. , vol.8 , Issue.2 , pp. 405-410
    • Salahuddin, S.1    Datta, S.2
  • 5
    • 84857027947 scopus 로고    scopus 로고
    • Ferroelectric negative capacitance MOSFET: Capacitance tuning & antiferroelectric operation
    • 5-7 Dec.
    • Khan, A.I., Yeung, C.W., Chenming Hu, Salahuddin, S., "Ferroelectric negative capacitance MOSFET: Capacitance tuning & antiferroelectric operation," Electron Devices Meeting (IEDM), 2011 IEEE International, vol., no., pp.11.3.1-11.3.4, 5-7 Dec. 2011.
    • (2011) Electron Devices Meeting (IEDM), 2011 IEEE International , pp. 1131-1134
    • Khan, A.I.1    Yeung, C.W.2    Hu, C.3    Salahuddin, S.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.