Characterization of a micromachined thermal shear stress sensor

39th Aerospace Sciences Meeting and Exhibit

Volumn , Issue , 2001, Pages

  Chandrasekaran, Venkataraman ^a   Cain, Anthony ^a,c   Nishida, Toshikazu ^b   Cattafesta, Louis N ^a   Sheplak, Mark ^a  

^a Interdisciplinary Microsystems Group   (United States)

^b University of Florida   (United States)

^c AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AEROSPACE ENGINEERING; STRESS MEASUREMENT;

CONSTANT CURRENT; DYNAMIC CALIBRATION; EXTERNAL BIASING; FOUR-POINT PROBE MEASUREMENTS; MICRO-MACHINED; PRESSURE SENSITIVITIES; THERMAL SHEAR-STRESS SENSOR; TURBULENCE MEASUREMENTS;

SHEAR STRESS;

EID: 85087599695     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.2514/6.2001-247     Document Type: Conference Paper

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