The EIGER detector for low-energy electron microscopy and photoemission electron microscopy

Journal of Synchrotron Radiation

Volumn 24, Issue 5, 2017, Pages 963-974

  Tinti, G ^a   Marchetto, H ^b,c   Vaz, C A F ^a   Kleibert, A ^a   Andra M ^a   Barten, R ^a   Bergamaschi, A ^a   Bruckner M ^a   Cartier, S ^a   Dinapoli, R ^a   Franz, T ^b   Frojdh E ^a   Greiffenberg, D ^a   Lopez Cuenca, C ^a   Mezza, D ^a   Mozzanica, A ^a   Nolting, F ^a   Ramilli, M ^a   Redford, S ^a   Ruat, M ^a   Ruder, Ch ^a   Schadler L ^a   Schmidt, Th ^c   Schmitt, B ^a   Schutz F ^b   Shi, X ^a   Thattil, D ^a   Vetter, S ^a   Zhang, J ^a   more..

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b ELMITEC GmbH   (Germany)

^c FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

Author keywords

hybrid pixel detectors; instrumentation for synchrotron radiation accelerators; LEEM; PEEM; single photon counters; X ray detectors

Indexed keywords

ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRONIC PROPERTIES; LIGHT SOURCES; NANOMAGNETICS; PARTICLE BEAMS; PHOTOEMISSION; PHOTONS; PIXELS; RADIATION DAMAGE; READOUT SYSTEMS; SIGNAL TO NOISE RATIO; SYNCHROTRON RADIATION; SYNCHROTRONS;

HYBRID PIXEL DETECTORS; LEEM; PEEM; RADIATION ACCELERATORS; SINGLE-PHOTON COUNTERS; X-RAY DETECTOR;

ELECTRONS;

EID: 85028722279     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S1600577517009109     Document Type: Article

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