Pixelated detectors and improved efficiency for magnetic imaging in STEM differential phase contrast

Ultramicroscopy

Volumn 165, Issue , 2016, Pages 42-50

  Krajnak, Matus ^a   McGrouther, Damien ^a   Maneuski, Dzmitry ^a   O'Shea, Val ^a   McVitie, Stephen ^a  

^a UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

4D electron microscopy; Differential phase contrast; Magnetic thin films; STEM

Indexed keywords

DATA HANDLING; ELECTRON MICROSCOPY; FILMS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MAGNETIC DEVICES; MAGNETIC THIN FILMS; MAGNETISM; PIXELS; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

ABERRATION-CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPIES; D ELECTRONS; DIFFERENTIAL PHASE CONTRAST; DIFFERENTIAL PHASE CONTRAST IMAGING; DIFFRACTION CONTRAST; GRANULAR STRUCTURESS; HARDWARE DEVELOPMENT; PIXELATED DETECTORS;

IMAGE PROCESSING;

ARTICLE; CAMERA; COMPUTER; IMAGE ANALYSIS; IMAGE PROCESSING; INTERMETHOD COMPARISON; MAGNETISM; MATHEMATICAL ANALYSIS; PHASE CONTRAST MICROSCOPY; RADIATION DETECTOR; SCANNING TRANSMISSION ELECTRON MICROSCOPY; TIME;

EID: 84962786575     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2016.03.006     Document Type: Article

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