메뉴 건너뛰기




Volumn 114, Issue , 2015, Pages 172-187

Functional nanostructured oxides

Author keywords

[No Author keywords available]

Indexed keywords

CONTROL RODS; DEPOSITION; INERT GASES; NANORODS; PULSED LASER DEPOSITION;

EID: 85027946252     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2014.12.023     Document Type: Article
Times cited : (68)

References (111)
  • 26
    • 0004008156 scopus 로고
    • H. Reiss, Pergamon Press Oxford
    • J.B. Goodenough H. Reiss, Metallic oxides 1971 Pergamon Press Oxford 145
    • (1971) Metallic Oxides , pp. 145
    • Goodenough, J.B.1
  • 35
    • 85028166096 scopus 로고    scopus 로고
    • Fiebig M, Eremenko VV, Chupis IE. 1st ed. Springer Publishing, 2004, p. 166.
    • Fiebig M, Eremenko VV, Chupis IE. 1st ed. Springer Publishing, 2004, p. 166.
  • 38
    • 85028134381 scopus 로고    scopus 로고
    • Sugano S, Tanabe Y, Kamimura H. New York: Academic Press, 1970.
    • Sugano S, Tanabe Y, Kamimura H. New York: Academic Press, 1970.
  • 51
    • 0041903002 scopus 로고    scopus 로고
    • Optical limiting
    • M. Bass, OSA
    • D.J. Hagan Optical limiting M. Bass, Handbook of optics vol. IV 2000 OSA
    • (2000) Handbook of Optics , vol.4
    • Hagan, D.J.1
  • 88
    • 85028131476 scopus 로고    scopus 로고
    • M. Fanciulli, G. Scarel, Topics appl. physics
    • S. Shamm, G. Scarel, and M. Fanciulli M. Fanciulli, G. Scarel, Rare earth oxide films Topics appl. physics vol. 106 2007 153 177
    • (2007) Rare Earth Oxide Films , vol.106 , pp. 153-177
    • Shamm, S.1    Scarel, G.2    Fanciulli, M.3
  • 89
    • 0034760081 scopus 로고    scopus 로고
    • Rare earth oxide films: Their preparation and characterization
    • T. Wiktorczyk Rare earth oxide films: their preparation and characterization Opt Appl 31 5 2001 153
    • (2001) Opt Appl , vol.31 , Issue.5 , pp. 153
    • Wiktorczyk, T.1
  • 90
    • 0035872897 scopus 로고    scopus 로고
    • High-k gate dielectrics: Current status and materials properties considerations
    • G.D. Wilk, R.M. Wallace, and J.M. Anthony High-k gate dielectrics: current status and materials properties considerations J Appl Phys 89 5243 2001 153 155
    • (2001) J Appl Phys , vol.89 , Issue.5243 , pp. 153-155
    • Wilk, G.D.1    Wallace, R.M.2    Anthony, J.M.3
  • 93
    • 42749103016 scopus 로고    scopus 로고
    • Structure and stability of rare-earth and transition-metal oxides
    • 172103
    • L. Marsella, and V. Fiorentini Structure and stability of rare-earth and transition-metal oxides Phys Rev B 69 172103 2004 154
    • (2004) Phys Rev B , vol.69 , pp. 154
    • Marsella, L.1    Fiorentini, V.2
  • 100
    • 85028158545 scopus 로고    scopus 로고
    • M. Fanciulli, G. Scarel, Topics appl. physics
    • J. Schubert, T. Heeg, and M. Wagner M. Fanciulli, G. Scarel, Rare earth oxide films Topics appl. physics vol. 106 2007 115 126
    • (2007) Rare Earth Oxide Films , vol.106 , pp. 115-126
    • Schubert, J.1    Heeg, T.2    Wagner, M.3
  • 104
    • 85028174300 scopus 로고    scopus 로고
    • Sotobe S, [M.Sc. dissertation], University of Western Cape, 2009.
    • Sotobe S, [M.Sc. dissertation], University of Western Cape, 2009.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.