Photo-induced phenomena in GeO2 glass

Journal of Non-Crystalline Solids

Volumn 352, Issue 36-37, 2006, Pages 3815-3822

  Terakado, Nobuaki ^a   Tanaka, Keiji ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

Author keywords

Absorption; Chalcogenides; Defects; Electron spin resonance; Germania; Glasses; Laser matter interactions; Luminescence; Optical spectroscopy; Photo induced effects; Radiation effects; Raman spectroscopy; Raman scattering; Silica; X ray diffraction

Indexed keywords

ABSORPTION; DEFECTS; GERMANIUM; LUMINESCENCE; PARAMAGNETIC RESONANCE; RADIATION EFFECTS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SILICA; X RAY DIFFRACTION;

CHALCOGENIDES; GERMANIA; LASER-MATTER INTERACTIONS; OPTICAL SPECTROSCOPY; PHOTO-INDUCED EFFECTS;

GLASS;

EID: 33748295544     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2006.06.018     Document Type: Article

References (55)

1. Shimakawa K., Kolobov A., and Elliott S.R. Adv. Phys. 44 (1995) 475
2. Tanaka K. In: Lucovsky G., and Popescu M. (Eds). Optoelectronic Materials and Devices vol. 1 (2004), INOE Publishing House, Bucharest 43
3. 2 and Related Dielectrics: Science and Technology (2000), Kluwer Academic, Dordrecht
4. Gonzales-Leal J.M., Krecmer P., Prokop J., and Elliott S.R. In: Kolobov A.V. (Ed). Photo-induced Metastability in Amorphous Semiconductors (2003), Wiley-VCH, Weinheim Chapter 20.
5. Ohta T., and Ovshinsky S.R. In: Kolobov A.V. (Ed). Photo-induced Metastability in Amorphous Semiconductors (2003), Wiley-VCH, Weinheim Chapter 18
6. Yin Z., Jessop P.E., and Garside B.K. Appl. Opt. 22 (1983) 4088
7. Sakaguchi S., and Todoroki S. Appl. Opt. 36 (1997) 6809
8. Terakado N., and Tanaka K. J. Non-Cryst. Solids 351 (2005) 54
9. Tanaka K., Kasanuki Y., and Odajima A. Thin Solids Films 117 (1984) 251
10. Watanabe Y., Nishii J., Moriwaki H., Furuhashi G., Hosono H., and Kawazoe H. J. Non-Cryst. Solids 239 (1998) 104
11. Awazu K. J. Non-Cryst. Solids 337 (2004) 241
12. Margaryan A. Germanate Glasses (1993), Artech House, Boston
13. 2. For band-gap light of 6.4 eV, the penetration depth was ∼10 μm. However, the present glass ingots were very fragile, and accordingly, 25 μm-thick samples were inspected instead. In some cases, samples were exposed to light at both surfaces to enhance exposure effects. For γ-rays, the penetration depth was estimated to be ∼5 cm, and thick samples could be employed.
14. Cohen A.J., and Smith H.L. J. Phys. Chem. Solids 7 (1958) 301
15. Jackson J.M., Wells M.E., Kordas G., Kinser D.L., Weeks R.A., and Magruder III R.H. J. Appl. Phys. 58 (1985) 2309
16. For this calculation, absorption coefficients are taken from Fig. 1.
17. Tanaka K., Gotoh T., Yoshida N., and Nonomura S. J. Appl. Phys. 91 (2002) 125
18. Bohac P., Jastrabik L., Chvostova D., and Zelezny V. Vacuum 41 (1990) 1466
19. Pajasova L., Chvostova D., Jastrabik L., and Polach J. J. Non-Cryst. Solids 182 (1995) 286
20. Weeks R.A., and Purcell T. J. Chem. Phys. 43 (1965) 483
21. Trukhin A.N., and Kulis P. J. Non-Cryst. Solids 188 (1995) 125
22. Hosono H., Abe Y., Kinser D.L., Weeks R.A., Muta K., and Kawazoe H. Phys. Rev. B 46 (1992) 11445
23. Tamura T., Lu G.-H., and Yamamoto R. Phys. Rev. B 69 (2004) 195204
24. Tsai T.E., Griscom D.L., and Friebele E.J. J. Appl. Phys. 62 (1987) 2264
25. Heath J.R., Shiang J.J., and Alivisatos A.P. J. Chem. Phys. 101 (1994) 1607
26. Okamoto S., and Kanemitsu Y. Phys. Rev. B 54 (1996) 16421
27. Skuja L., Hosono H., Mizuguchi M., Guttler B., and Silin A. J. Lumines. 87 (2000) 699
28. Trukhin A.N. J. Non-Cryst. Solids 189 (1995) 291
29. Maeda Y. Phys. Rev. B 51 (1995) 1658
30. Wu X.M., Lu M.J., and Yao W.G. Surf. Coat. Technol. 161 (2002) 92
31. Kartopu G., Bayliss S.C., Karavanskii V.A., Curry R.J., Turan R., and Sapelkin A.V. J. Lumines. 101 (2003) 275
32. Trukhin A.N., Jansons J., Fitting H.-J., Barfels T., and Schmidt B. J. Non-Cryst. Solids 331 (2003) 91
33. Qiu J., Wada N., Ogura F., Kojima K., and Hirao K. J. Phys. Condens. Matter 14 (2002) 2561
34. Skuja L., Hosono H., and Hirano M. Proc. SPIE 155 (2001) 4347
35. Thickness changes by 3.5 eV light were not examined, and the change could not be evaluated for γ-ray, since a knife edge or a pin hole was needed for step measurements.
36. Such kinetics was not inspected for the 4.6 eV sub-gap excitation due to the limited pulse-repetition rate of 5 Hz.
37. Hisakuni H., and Tanaka K. Opt. Lett. 20 (1995) 958
38. Giacomazzi L., Umari P., and Pasquarello A. Phys. Rev. Lett. 95 (2005) 75505
39. Hubbard B.E., Tu J.J., Agladze N.I., and Sievers A.J. Phys. Rev. B 67 (2003) 144201
40. Barrio R.A., Galeener F.L., Martinez E., and Elliott R.J. Phys. Rev. B 43 (1993) 15672
41. Mernagh T.P., and Liu L.-G. Phys. Chem. Miner. 24 (1997) 7
42. Liu F.X., Qian J.Y., Wang X.L., Liu L., and Ming H. Phys. Rev. B 56 (1997) 3066
43. Kohara S., and Suzuya K. J. Phys. Condens. Matter 17 (2005) S77
44. Haines J., Leger J.M., and Chateau C. Phys. Rev. B 61 (2000) 8701
45. 4 pulses.
46. Yiannopoulos Y.D., Varsamis C.P.E., and Kamitsos E.I. Chem. Phys. Lett. 359 (2002) 246
47. Ravindra N.M., Weeks R.A., and Kinser D.L. Phys. Rev. B 36 (1987) 6122
48. Stapelbroek M., and Evans B.D. Solid State Commun. 25 (1978) 959
49. Blaineau S., Jund P., and Drabold D.A. Phys. Rev B 351 (2003) 54
50. Ikuta Y., Kajihara K., Hirao M., and Hosono H. Appl. Opt. 43 (2004) 2332
51. Pontuschka W.M., and Taylor P.C. Solid State Commun. 38 (1981) 573
52. Primak W. Phys. Rev. 110 (1957) 1240
53. Hamanaka H., Tanaka K., and Iizima S. Solid State Commun. 33 (1980) 355
54. Tanaka K. Phys. Rev. B 57 (1998) 5163
55. Shimakawa K., and Ganjoo A. J. Opt. Adv. Mater. 3 (2001) 167