Intrinsic optical properties and enhanced plasmonic response of epitaxial silver

Advanced Materials

Volumn 26, Issue 35, 2014, Pages 6106-6110

  Wu, Yanwen ^a,b   Zhang, Chengdong ^a   Estakhri, N Mohammadi ^c   Zhao, Yang ^c   Kim, Jisun ^a   Zhang, Matt ^a   Liu, Xing Xiang ^c   Pribil, Greg K ^d   Alù, Andrea ^c   Shih, Chih Kang ^a   Li, Xiaoqin ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^b UNIVERSITY OF SOUTH CAROLINA   (United States)

^c The University of Texas at Austin   (United States)

^d J A WOOLLAM CO INC   (United States)

Author keywords

ellipsometry; epitaxial growth; optical constants; plasmon

Indexed keywords

ELECTROMAGNETIC WAVE POLARIZATION; ELLIPSOMETRY; EPITAXIAL GROWTH; GRAIN BOUNDARIES; OPTICAL CONSTANTS; OPTICAL PROPERTIES; PERMITTIVITY; PLASMONS;

INTRINSIC OPTICAL PROPERTIES; LOCALIZED PLASMONS; OPTICAL PERMITTIVITY; PLASMONIC RESPONSE; PROPAGATION DISTANCES; SPECTRAL FEATURE; SURFACE PLASMON POLARITONS; VISIBLE FREQUENCIES;

SILVER;

EID: 85027920506     PISSN: 09359648     EISSN: 15214095     Source Type: Journal    
DOI: 10.1002/adma.201401474     Document Type: Article

References (29)

1. A. Boltasseva, H. A. Atwater, Science 2011, 331, 290.
2. J. B. Khurgin, A. Boltasseva, MRS Bull. 2012, 37, 768.
3. P. Tassin, T. Koschny, M. Kafesaki, C. M. Soukoulis, Nat. Photonics 2012, 6, 259.
4. P. B. Johnson, R. W. Christy, Phys. Rev. B 1972, 6, 4370.
5. E. D. Palik, Handbook of Optical Constants of Solids, 3, Academic Press, 1998.
6. Y.-J. Lu, J. Kim, H.-Y. Chen, C. Wu, N. Dabidian, C. E. Sanders, C.-Y. Wang, M.-Y. Lu, B.-H. Li, X. Qiu, W.-H. Chang, L.-J. Chen, G. Shvets, C.-K. Shih, S. Gwo, Science 2012, 337, 450.
7. L. Huang, S. Jay Chey, J. H. Weaver, Surf. Sci. 1998, 416, L1101.
8. H. Yu, C. Jiang, P. Ebert, X. Wang, J. White, Q. Niu, Z. Zhang, C. Shih, Phys. Rev. Lett. 2001, 88, 016102.
9. A. R. Smith, K.-J. Chao, Q. Niu, C.-K. Shih, Science (80-.). 1996, 273, 226.
10. M. Horn-von Hoegen, T. Schmidt, G. Meyer, D. Winau, K. Rieder, Phys. Rev. B 1995, 52, 10764.
11. N. I. Zheludev, S. L. Prosvirnin, N. Papasimakis, V. A. Fedotov, Nat. Photonics 2008, 2, 351.
12. S. A. Maier, M. L. Brongersma, P. G. Kik, S. Meltzer, A. A. G. Requicha, H. A. Atwater, Adv. Mater. 2001, 13, 1501.
13. V. M. Shalaev, Nat. Photonics 2007, 1, 41.
14. J. N. Hilfiker, N. Singh, T. Tiwald, D. Convey, S. M. Smith, J. H. Baker, H. G. Tompkins, Thin Solid Films 2008, 516, 7979.
15. H. Arwin, D. E. Aspnes, Thin Solid Films 1984, 113, 101.
16. G. K. Pribil, B. Johs, N. J. Ianno, Thin Solid Films 2004, 455-456, 443.
17. C. M. Herzinger, B. D. Johs, Dielectric Function Parametric Model, and Method of Use 1998, US5796983 A.
18. O. Hunderi, Phys. Rev. B 1973, 7, 3419.
19. P. Nagpal, N. C. Lindquist, S.-H. Oh, D. J. Norris, Science 2009, 325, 594.
20. S. Zhang, D. A. Genov, Y. Wang, M. Liu, X. Zhang, Phys. Rev. Lett. 2008, 101, 047401.
21. S. H. Mousavi, A. B. Khanikaev, G. Shvets, Phys. Rev. B 2012, 85, 155429.
22. B. Luk'yanchuk, N. I. Zheludev, S. A. Maier, N. J. Halas, P. Nordlander, H. Giessen, C. T. Chong, Nat. Mater. 2010, 9, 707.
23. D. Bergman, M. Stockman, Phys. Rev. Lett. 2003, 90, 027402.
24. M. A. Noginov, G. Zhu, A. M. Belgrave, R. Bakker, V. M. Shalaev, E. E. Narimanov, S. Stout, E. Herz, T. Suteewong, U. Wiesner, Nature 2009, 460, 1110.
25. R. F. Oulton, V. J. Sorger, T. Zentgraf, R.-M. Ma, C. Gladden, L. Dai, G. Bartal, X. Zhang, Nature 2009, 461, 629.
26. B.-H. Li, C. E. Sanders, J. McIlhargey, F. Cheng, C. Gu, G. Zhang, K. Wu, J. Kim, S. H. Mousavi, A. B. Khanikaev, Y.-J. Lu, S. Gwo, G. Shvets, C.-K. Shih, X. Qiu, Nano Lett. 2012, 12, 6187.
27. Y. Sun, Y. Xia, Science 2002, 298, 2176.
28. A. Ben Moshe, G. Markovich, Chem. Mater. 2011, 23, 1239.
29. L.-P. Jiang, S. Xu, J.-M. Zhu, J.-R. Zhang, J.-J. Zhu, H.-Y. Chen, Inorg. Chem. 2004, 43, 5877.