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Surface Science

Volumn 416, Issue 1-2, 1998, Pages

Metastable structures and critical thicknesses: Ag on Si(111)-7 × 7

(3) Huang, Lin a Chey, S Jay a Weaver, J H a

a UNIVERSITY OF MINNESOTA (United States)

Author keywords

Epitaxy; Growth; Scanning tunneling microscopy; Silicon; Silver; Surface structure, morphology, roughness and topography

Indexed keywords

CRYSTALLIZATION; EPITAXIAL GROWTH; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SILVER; SURFACE ROUGHNESS; SURFACE STRUCTURE;

METASTABLE STRUCTURES; NONEQUILIBRIUM THIN FILMS;

THIN FILMS;

EID: 0032181949 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(98)00627-X Document Type: Article

Times cited : (85)

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