Comparison of models and whole-genome profiling approaches for genomic-enabled prediction of Septoria tritici blotch, Stagonospora nodorum blotch, and tan spot resistance in wheat

Plant Genome

Volumn 10, Issue 2, 2017, Pages

  Juliana, Philomin ^a   Singh, Ravi P ^b   Singh, Pawan K ^b   Crossa, Jose ^b   Rutkoski, Jessica E ^a,b   Poland, Jesse A ^c   Bergstrom, Gary C ^a   Sorrells, Mark E ^a  

^a Department of Obstetrics Gynecology   (United States)

^b INTERNATIONAL MAIZE AND WHEAT IMPROVEMENT CENTER CIMMYT   (Mexico)

^c KANSAS STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ASCOMYCETES; BAYES THEOREM; BIOLOGICAL MODEL; COMPARATIVE STUDY; GENE EXPRESSION PROFILING; GENE LINKAGE DISEQUILIBRIUM; GENETIC MARKER; GENETICS; ISOLATION AND PURIFICATION; MICROBIOLOGY; PHENOTYPE; PLANT DISEASE; PLANT GENE; QUANTITATIVE TRAIT LOCUS; WHEAT;

ASCOMYCOTA; BAYES THEOREM; GENE EXPRESSION PROFILING; GENES, PLANT; GENETIC MARKERS; LINKAGE DISEQUILIBRIUM; MODELS, GENETIC; PHENOTYPE; PLANT DISEASES; QUANTITATIVE TRAIT LOCI; TRITICUM;

EID: 85024501690     PISSN: None     EISSN: 19403372     Source Type: Journal    
DOI: 10.3835/plantgenome2016.08.0082     Document Type: Article

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