Scanning spreading resistance microscopy study of a metalorganic chemical vapor deposited grown InP optoelectronic structure

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 19, Issue 4, 2001, Pages 1752-1757

  Dixon Warren, St J ^a   lu, R P ^a   Ingrey, S ^a   Macquistan, D ^a   Bryskiewicz, T ^a   Smith, G ^a   Bryskiewicz, B ^a  

^a NORTEL NETWORKS   (Canada)

Author keywords

InP

Indexed keywords

EID: 85013596495     PISSN: 07342101     EISSN: 15208559     Source Type: Journal    
DOI: 10.1116/1.1366704     Document Type: Conference Paper

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