Zernike-type phase contrast X-ray microscopy at 4 keV photon energy with 60 nm resolution

AIP Conference Proceedings

Volumn 705, Issue , 2004, Pages 1255-1258

  Neuhäusler, Ulrich ^a   Schneider, Gerd ^b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85012307142     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.1758028     Document Type: Conference Paper

References (10)

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3. Oestreich, S., Kaulich, B., and Susini, J., Rev. Sci. Instrum.,70 1921-1925 (1999).
4. Zernike, F., Z. f. Techn. Physik,11, 454-457 (1935).
5. Schneider, G., Ultramicroscopy,75, 85-104 (1998).
6. Neuhausler, U., Schneider, G., Ludwig, W., and Hambach, D., Proceedings of the 7th International Conference on X-ray microscopy, J. Phys. IV France,104, 567-570 (2003).
7. Schneider, G., Hambach, D., Niemann, B., Kaulich, B., Susini, J., Hoffmann, N., and Hasse, W., Appl. Phys. Lett.,78(13) 1936-1938 (2001).
8. Schneider, G., Denbeaux, G., Anderson, E., Bates, B., Pearson, A., Meyer, M., Zschech, E., Hambach, D., and Stach, E., Appl. Phys. Lett.,81(14), 2535-2537 (2002).
9. Neuhausler, U., Schneider, G., Ludwig,W.,Meyer, M.A., Zschech, E., and Hambach, D., J. Phys. D: Appl. Phys.,36, A79-A82 (2003).
10. Neuhausler, U., Schneider, G., Ludwig, W., Meyer, M.A., Zschech, E., and Hambach, D., ESRF Highlights, 84-85 (2002).