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Volumn 104, Issue , 2003, Pages 567-570

Phase contrast x-ray microscopy at 4 keV photon energy with 60 nm resolution

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMIGRATION; INTEGRATED CIRCUIT LAYOUT; LIGHT ABSORPTION; MICROELECTRONICS; PHOTONS; X RAY OPTICS;

EID: 0038363742     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:20030145     Document Type: Conference Paper
Times cited : (16)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.