A Wide Power Supply Range, Wide Tuning Range, All Static CMOS All Digital PLL in 65 nm SOI

IEEE Journal of Solid-State Circuits

Volumn 43, Issue 1, 2008, Pages 42-51

  Tierno, José A ^a   Rylyakov, Alexander V ^a   Friedman, Daniel J ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Bang bang phase and frequency detectors; digital phase locked loops; phase locked loops

Indexed keywords

EID: 85008054348     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/JSSC.2007.910966     Document Type: Article

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