Competition between substrate-mediated π - π stacking and surface-mediated Tg depression in ultrathin conjugated polymer films

European Physical Journal E

Volumn 35, Issue 12, 2012, Pages

  Wang, Tao ^a   Pearson, Andrew J ^a   Dunbar, Alan D F ^a   Staniec, Paul A ^b   Watters, Darren C ^a   Coles, David ^a   Yi, Hunan ^a   Iraqi, Ahmed ^a   Lidzey, David G ^a   Jones, Richard A L ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

^b DIAMOND LIGHT SOURCE LTD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CONJUGATED POLYMERS; GLASS TRANSITION; INTERFACES (MATERIALS); SEMICONDUCTING FILMS; THIN FILMS; ULTRATHIN FILMS; X RAY DIFFRACTION;

BULK VALUE; CHAIN CONFORMATIONS; CONSTANT VALUES; DEPTH DEPENDENTS; GRAZING INCIDENCE X-RAY DIFFRACTION; MOLECULAR ORGANIZATION; PI-STACKING; SURFACE AND INTERFACES;

POLYMER FILMS;

EID: 84994684102     PISSN: 12928941     EISSN: 1292895X     Source Type: Journal    
DOI: 10.1140/epje/i2012-12129-3     Document Type: Article

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