Twin symmetry texture of energetically condensed niobium thin films on sapphire substrate (a-plane Al2O3)

Journal of Applied Physics

Volumn 110, Issue 3, 2011, Pages

  Zhao, X ^a   Phillips, L ^a   Reece, C E ^a   Seo, Kang ^b   Krishnan, M ^c   Valderrama, E ^c  

^a THOMAS JEFFERSON NATIONAL ACCELERATOR FACILITY   (United States)

^b NORFOLK STATE UNIVERSITY   (United States)

^c ALAMEDA APPLIED SCIENCES CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; BACKSCATTERING; CRYSTAL IMPURITIES; CRYSTAL ORIENTATION; DEPOSITION; EPITAXIAL GROWTH; MOLECULAR BEAM EPITAXY; NIOBIUM; POLES; SAPPHIRE; X RAY DIFFRACTION;

AMERICAN INSTITUTE OF PHYSICS; CATHODIC ARC DISCHARGES; ELECTRON BACKSCATTERING DIFFRACTION; ENERGETIC CONDENSATION; EPITAXIAL RELATIONSHIPS; RESIDUAL RESISTANCE RATIOS; SUBSTRATE TEMPERATURE; X RAY DIFFRACTION POLE FIGURE;

THIN FILMS;

EID: 84991011206     PISSN: 00218979     EISSN: 10897550     Source Type: Journal    
DOI: 10.1063/1.3611406     Document Type: Article

References (24)

1. R. Banerjee, E. A. Sperling, G. B. Thompson, H. L. Fraser, S. Bose, and P. Ayyub, Appl. Phys. Lett. 82, 4250 (2003).
2. D. F. McMorrow, R. A. Cowley, A. Gibaud, R. C. C. Ward, and M. R. Wells, Appl. Phys. Lett. 63, 2195 (1993).
3. T. Wagner, J. Mat. Res. 13, 693 (1998).
4. T. Wagner, M. Lorenz, and M. Ruhle, J. Mat. Res. 11, 1255 (1996).
5. P. B. Welander and J. N. Eckstein, Appl. Phys. Lett. 90, 243510 (2007).
6. A. R. Wildes, J. Mayer, and K. Theis-Brohl, Thin Solid Films 401, 7 (2001).
7. S. A. Wolf, S. B. Qadri, J. J. Claassen, T. L. Francavilla, and B. J. Dalrymple, J. Vac. Sci. Technol. A 4, 524 (1986).
8. G. Carapella, N. Martucciello, G. Costabile, C. Ferdeghini, V. Ferrando, and G. Grassano, Appl. Phys. Lett. 80, 2949 (2002).
9. S. K. Tolpygo and D. Amparo, J. Appl. Phys. 104, 063904 (2008).
10. S. Calatroni, Physica C 441, 95 (2006).
11. A. Gurevich, Appl. Phys. Lett. 88, 012511 (2006).
12. R. Russo, A. Cianchi, Y. H. Akhmadeev, L. Catani, J. Langner, J. Lorkiewicz, R. Polini, B. Ruggiero, M. J. Sadowski, S. Tazzari, and N. N. Koval, Surface and Coatings Technology 201, 3987 (2006).
13. J. H. Claassen, S. A. Wolf, S. B. Qadri, and L. D. Jones, J. Crystal Growth 81, 557 (1987).
14. S. B. Qadri, J. H. Claassen, P. R. Broussard, and S. A. Wolf, J. Less Common Metals 155, 327 (1989).
15. M. Krishnan, B. Bures, K. Wilson Elliott, S. Leandro, X. Zhao, A.-M. Valente-Feliciano, L. Phillips, B. Xiao, C. Reece, and K. Seo, in Proceedings of 14th International Conference on RF Superconductivity (SRF2009), Berlin, Germany, p. 396, TUPPO069 (2009).
16. H. Padamsee, J. Knobloch, and T. Hays, RF Superconductivity for Accelerators, 2nd ed. (2007).
17. X. Zhao, A.-M. Valente-Feliciano, C. Xu, R. L. P. Geng, L. C. E. Reece, K. Seo, R. Crooks, M. Krishnan, A. Gerhan, B. Bures, K. W. Elliott, and J. Wright, J. Vac. Sci. Tech. A 27, 620 (2009).
18. A. Anders, Thin Solid Films 518, 4087 (2010).
19. J. S. Colligon, J. Vac. Sci. Technol. A 13, 1649 (1995).
20. B. D. Cullity, Elements of X-Ray Diffraction (1978).
21. A. J. Schwartz, Electron Backscatter Diffraction in Materials Science (Springer, New York, 2009).
22. L. H. V. Vlack, Materials Science for Engineers (Addison-Wesley, Reading, MA, 1970).
23. C. V. Thompson, Annu. Rev. Mater. Sci. 30, 159 (2000).
24. C. V. Thompson, Annu. Rev. Mater. Sci. 20, 245 (1990).