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Volumn 6, Issue 4, 2006, Pages

Identification of optocoupler devices with RTS noise

Author keywords

Optocoupler device; RTS noise

Indexed keywords


EID: 33846071542     PISSN: 02194775     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0219477506003550     Document Type: Article
Times cited : (9)

References (6)
  • 1
    • 0001013323 scopus 로고    scopus 로고
    • Photodetectors for optical fiber communications
    • ed. H. S. Nalwa Academic Press
    • A. Bandyopadhyay and M. J. Deen, Photodetectors for optical fiber communications, Photodetectors and Fiber Optics, ed. H. S. Nalwa (Academic Press, 2001) 307-368.
    • (2001) Photodetectors and Fiber Optics , pp. 307-368
    • Bandyopadhyay, A.1    Deen, M.J.2
  • 3
    • 4344643127 scopus 로고    scopus 로고
    • The different physical origins of 1/f noise and superimosed RTS noise in light-emitting quantum dot diodes
    • A. V. Belyakov, L. K. J. Vandamme, M. Yu. Perov, A.V. Yakimov, The different physical origins of 1/f noise and superimosed RTS noise in light-emitting quantum dot diodes, Fluctuation and Noise Letters 3 (2003) L325-339.
    • (2003) Fluctuation and Noise Letters , vol.3
    • Belyakov, A.V.1    Vandamme, L.K.J.2    Perov, M.Y.3    Yakimov, A.V.4
  • 4
    • 58149270443 scopus 로고    scopus 로고
    • Measurement and analysis methods for random telegraph signals
    • Proc. of Advanced Experimental Methods for Noise Reaserch in Nanoscale Electron Devices, ed. J. Sikula and M. Levinshtein
    • Z. Celik-Butler, Measurement and analysis methods for random telegraph signals, in Proc. of Advanced Experimental Methods for Noise Reaserch in Nanoscale Electron Devices, ed. J. Sikula and M. Levinshtein (Kluwer Academic Publisher, NATO Science Series. II. Mathematics, Physics and Chemistry), Vol. 151 (2004) 219-226.
    • (2004) Kluwer Academic Publisher, NATO Science Series. II. Mathematics, Physics and Chemistry , vol.151 , pp. 219-226
    • Celik-Butler, Z.1
  • 5
    • 33846016878 scopus 로고    scopus 로고
    • The method for burst noise detection, particularly in semiconductor devices, Patent application P-375610, Polish
    • Patent Office
    • J. Cichosz and A. Szatkowski, The method for burst noise detection, particularly in semiconductor devices, Patent application P-375610, Polish Patent Office (2005).
    • (2005)
    • Cichosz, J.1    Szatkowski, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.