Noise scattering patterns method for recognition of RTS noise in semiconductor components

AIP Conference Proceedings

Volumn 780, Issue , 2005, Pages 673-676

  Cichosz, Jacek A ^a   Szatkowski, Andrzej ^b  

^a GDANSK UNIVERSITY OF TECHNOLOGY   (Poland)

^b POMERANIAN UNIVERSITY IN S UPSK   (Poland)

Author keywords

RTS noise; Semiconductor components; Stochastic analysis

Indexed keywords

EID: 33749471654     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2036841     Document Type: Conference Paper

References (3)

1. Celik-Butler, Z., Measurement and Analysis Method for Random Telegraph Signals, Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices, edited by J. Sikula and M. Levinshtein, Dordrecht, Boston, London: Kluwer Academic Publishers, 2004, pp. 219-226.
2. Wel, A.P. van der, Klumperink, E.A.M., Kolhatkar, J.S., Hoekstra, E., Nauta, B., Visualisation Techniques for Random Telegraph Signals in MOSFETs, ProRisc, Veldhoven, Proceedings and Poster, http://icd.el.utwente.nl/ publications/index.php.
3. rd European Solid State Device Research Conference ESSDERC03, IEEE, 2003, pp. 549-552.