Critical Current Scaling in Long Diffusive Graphene-Based Josephson Junctions

Nano Letters

Volumn 16, Issue 8, 2016, Pages 4788-4791

  Ke, Chung Ting ^a   Borzenets, Ivan V ^b   Draelos, Anne W ^a   Amet, Francois ^a,c   Bomze, Yuriy ^a   Jones, Gareth ^d   Craciun, Monica ^d   Russo, Saverio ^d   Yamamoto, Michihisa ^b   Tarucha, Seigo ^b,e   Finkelstein, Gleb ^a  

^a DUKE UNIVERSITY   (United States)

^b UNIVERSITY OF TOKYO   (Japan)

^c APPALACHIAN STATE UNIVERSITY   (United States)

^d UNIVERSITY OF EXETER   (United Kingdom)

^e RIKEN Center for Emergent Matter Science   (Japan)

Author keywords

diffusive SNS junction; Graphene; Josephson junction; superconductivity; Thouless energy

Indexed keywords

CRITICAL CURRENTS; JOSEPHSON JUNCTION DEVICES; QUANTUM OPTICS; SUPERCONDUCTIVITY;

CONTACT WIDTH; GATE VOLTAGES; JOSEPHSON-JUNCTION; ORDERS OF MAGNITUDE; SINGLE-DOMAIN CRYSTALS; SNS JUNCTIONS; THOULESS ENERGY; TRANSPORT MEASUREMENTS;

GRAPHENE;

EID: 84981306328     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/acs.nanolett.6b00738     Document Type: Article

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