SCOPUS 정보 검색 플랫폼

Volumn 87, Issue 20, 2001, Pages

Coherent low-energy charge transport in a diffusive S-N-S junction

(4) Dubos, P a Courtois, H a Buisson, O a Pannetier, B a

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; CRITICAL CURRENTS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC RESISTANCE; ELECTRON REFLECTION; ELECTRON TRANSPORT PROPERTIES; ENERGY GAP; FERMI LEVEL; INTERFACES (MATERIALS); JOSEPHSON JUNCTION DEVICES; NIOBIUM; THERMAL EFFECTS;

ANDREEV REFLECTION; COHERENT LOW-ENERGY CHARGE TRANSPORT; DIFFERENTIAL RESISTANCE; MICROWAVE IRRADIATION; THOULESS ENERGY;

TUNNEL JUNCTIONS;

EID: 39249085485 PISSN: 00319007 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (75)

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