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Volumn 6, Issue 73, 2016, Pages 68663-68674

Effect of the thickness of the ZnO buffer layer on the properties of electrodeposited p-Cu2O/n-ZnO/n-AZO heterojunctions

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BUFFER LAYERS; CARRIER CONCENTRATION; ELECTRODEPOSITION; ELECTRODES; ENAMELS; ENERGY GAP; FIELD EMISSION MICROSCOPES; HETEROJUNCTIONS; METALLIC FILMS; NANOSTRUCTURES; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING FILMS; THIN FILMS; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE; ZINC SULFIDE;

EID: 84979879984     PISSN: None     EISSN: 20462069     Source Type: Journal    
DOI: 10.1039/c6ra04834j     Document Type: Article
Times cited : (37)

References (67)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.