Effect of thickness on the structural and optical properties of CuO thin films grown by successive ionic layer adsorption and reaction

Thin Solid Films

Volumn 594, Issue , 2015, Pages 30-34

  Akaltun, Yunus ^a  

^a ERZINCAN UNIVERSITY   (Turkey)

Author keywords

Dielectric properties; Optical properties; Oxides; Semiconductors; Thin films

Indexed keywords

COPPER OXIDES; DIELECTRIC PROPERTIES; DIELECTRIC PROPERTIES OF SOLIDS; ENERGY GAP; FILM THICKNESS; GLASS; OPTICAL PROPERTIES; OXIDES; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION;

CUO THIN FILMS; ELECTRON EFFECTIVE MASS; ENERGY BANDGAPS; GLASS SUBSTRATES; MONOCLINIC PHASIS; POLYCRYSTALLINE STRUCTURE; STRUCTURAL AND OPTICAL PROPERTIES; SUCCESSIVE IONIC LAYER ADSORPTION AND REACTIONS;

OPTICAL FILMS;

EID: 84964329884     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2015.10.003     Document Type: Article

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