The application of two-level attention models in deep convolutional neural network for fine-grained image classification

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn 07-12-June-2015, Issue , 2015, Pages 842-850

  Xiao, Tianjun ^a   Xu, Yichong ^b   Yang, Kuiyuan ^b   Zhang, Jiaxing ^b   Peng, Yuxin ^a   Zhang, Zheng ^c  

^a PEKING UNIVERSITY   (China)

^b MICROSOFT RESEARCH   (United States)

^c NEW YORK UNIVERSITY SHANGHAI   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BEHAVIORAL RESEARCH; COMPUTER VISION; DAMAGE DETECTION; NEURAL NETWORKS; PATTERN RECOGNITION; PIPELINES;

BOTTOM-UP ATTENTION; CLASSIFICATION SYSTEM; CLASSIFICATION TASKS; CONVOLUTIONAL NEURAL NETWORK; DEEP NEURAL NETWORKS; DISCRIMINATIVE FEATURES; FOREGROUND OBJECTS; VISUAL ATTENTION;

IMAGE CLASSIFICATION;

EID: 84959255406     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2015.7298685     Document Type: Conference Paper

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