메뉴 건너뛰기




Volumn , Issue , 2015, Pages 888-891

Creep-resistant nanocrystalline gold-vanadium alloyed microcorrugated diaphragms (MCDS)

Author keywords

Annealing; co sputtering; creep resistant; gold vanadium; grain size; microcorrugated diaphragm; nanocrystalline; RF MEMS; stress relaxation

Indexed keywords

ACTUATORS; ANNEALING; CREEP; CREEP RESISTANCE; DIAPHRAGMS; GRAIN SIZE AND SHAPE; MICROSYSTEMS; NANOCRYSTALS; SOLID-STATE SENSORS; STRESS RELAXATION; TRANSDUCERS;

EID: 84955503805     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TRANSDUCERS.2015.7181066     Document Type: Conference Paper
Times cited : (3)

References (9)
  • 1
    • 84904285343 scopus 로고    scopus 로고
    • A 23-35 GHz MEMS tunable all-silicon cavity filter with stability characterization up to 140 million cycles
    • Tampa, FL, Jun.
    • Z. Yang and D. Peroulis, "A 23-35 GHz MEMS tunable all-silicon cavity filter with stability characterization up to 140 million cycles, " in IEEE MTT-S Int. Microw. Symp. Dig., Tampa, FL, Jun. 2014, pp. 1-4.
    • (2014) IEEE MTT-S Int. Microw. Symp. Dig. , pp. 1-4
    • Yang, Z.1    Peroulis, D.2
  • 6
    • 34547684420 scopus 로고    scopus 로고
    • The influence of vanadium alloying on the elevatedtemperature mechanical properties of thin gold films
    • Apr.
    • M.-T. Lin, R. R. Chromik, N. Barbosa III, P. El-Deiry, S. Hyun, W. L. Brown, R. P. Vinci, T. J. Delph, "The influence of vanadium alloying on the elevatedtemperature mechanical properties of thin gold films, " Thin Solid Films, vol. 515, pp. 7919-7925, Apr. 2007.
    • (2007) Thin Solid Films , vol.515 , pp. 7919-7925
    • Lin, M.-T.1    Chromik, R.R.2    Barbosa, N.3    El-Deiry, P.4    Hyun, S.5    Brown, W.L.6    Vinci, R.P.7    Delph, T.J.8
  • 7
    • 78649660781 scopus 로고    scopus 로고
    • Temperature-dependent viscoelasticity in thin Au films and consequences for MEMS devices
    • Dec.
    • M. McLean, W. L. Brown, and R. P. Vinci, "Temperature-dependent viscoelasticity in thin Au films and consequences for MEMS devices, "J. Microelectromech. Syst., vol. 19, no. 6, pp. 1299-1308, Dec. 2010.
    • (2010) J. Microelectromech. Syst. , vol.19 , Issue.6 , pp. 1299-1308
    • McLean, M.1    Brown, W.L.2    Vinci, R.P.3
  • 8
    • 67549148361 scopus 로고    scopus 로고
    • Anelastic stress relaxation in gold films and its impact on restoring forces in MEMS devices
    • Jun.
    • X. Yan, W. L. Brown, Y. Li, J. Papapolymerou, C. Palego, J. C. M. Hwang, and R. P. Vinci, "Anelastic stress relaxation in gold films and its impact on restoring forces in MEMS devices, " J. Microelectromech. Syst., vol. 18, no. 3, pp. 570-576, Jun. 2009.
    • (2009) J. Microelectromech. Syst. , vol.18 , Issue.3 , pp. 570-576
    • Yan, X.1    Brown, W.L.2    Li, Y.3    Papapolymerou, J.4    Palego, C.5    Hwang, J.C.M.6    Vinci, R.P.7
  • 9
    • 0026140973 scopus 로고
    • Hall-Petch relation in nanocrystalline solids
    • T. G. Nieh and J. Wadsworth, "Hall-Petch relation in nanocrystalline solids, " Scripta Metallurgica et Materialia, vol. 25, no. 4, pp. 955-958. 1991.
    • (1991) Scripta Metallurgica et Materialia , vol.25 , Issue.4 , pp. 955-958
    • Nieh, T.G.1    Wadsworth, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.