-
1
-
-
84904285343
-
A 23-35 GHz MEMS tunable all-silicon cavity filter with stability characterization up to 140 million cycles
-
Tampa, FL, Jun.
-
Z. Yang and D. Peroulis, "A 23-35 GHz MEMS tunable all-silicon cavity filter with stability characterization up to 140 million cycles, " in IEEE MTT-S Int. Microw. Symp. Dig., Tampa, FL, Jun. 2014, pp. 1-4.
-
(2014)
IEEE MTT-S Int. Microw. Symp. Dig.
, pp. 1-4
-
-
Yang, Z.1
Peroulis, D.2
-
2
-
-
84905038374
-
High-Q MEMS-tunable W-band bandstop resonators
-
Tampa, FL, Jun.
-
E. J. Naglich, M. Sinani, S. Moon, and D. Peroulis, "High-Q MEMS-tunable W-band bandstop resonators, " in IEEE MTT-S Int. Microw. Symp. Dig., Tampa, FL, Jun. 2014, pp. 1-3.
-
(2014)
IEEE MTT-S Int. Microw. Symp. Dig.
, pp. 1-3
-
-
Naglich, E.J.1
Sinani, M.2
Moon, S.3
Peroulis, D.4
-
3
-
-
73049112335
-
Robustness of RF MEMS capacitive switches with molybdenum membranes
-
Dec.
-
C. Palego, J. Deng, Z. Peng, S. Halder, J. C. M. Hwang, D. I. Forehand, D. Scarbrough, C. L. Goldsmith, I. Johnston, S. K. Sampath, and A. Datta "Robustness of RF MEMS capacitive switches with molybdenum membranes, " IEEE Trans. Microw. Theory Techn., vol. 57, no. 12, pp. 3262-3269, Dec. 2009.
-
(2009)
IEEE Trans. Microw. Theory Techn.
, vol.57
, Issue.12
, pp. 3262-3269
-
-
Palego, C.1
Deng, J.2
Peng, Z.3
Halder, S.4
Hwang, J.C.M.5
Forehand, D.I.6
Scarbrough, D.7
Goldsmith, C.L.8
Johnston, I.9
Sampath, S.K.10
Datta, A.11
-
4
-
-
84878556953
-
RF MEMS switches with RuO2-Au contacts cycled to 10 billion cycles
-
Jun.
-
D. A. Czaplewski, C. D. Nordquist, G. A. Patrizi, G. M. Kraus, and W. D. Cowan, "RF MEMS switches with RuO2-Au contacts cycled to 10 billion cycles, " J. Microelectromech. Syst., vol. 22, no. 3, pp. 655-661, Jun. 2013.
-
(2013)
J. Microelectromech. Syst.
, vol.22
, Issue.3
, pp. 655-661
-
-
Czaplewski, D.A.1
Nordquist, C.D.2
Patrizi, G.A.3
Kraus, G.M.4
Cowan, W.D.5
-
5
-
-
21044437428
-
Creep-resistant aluminum alloys for use in MEMS
-
Jun.
-
R. Modlinski, P. Ratchev, A. Witvrouw, R. Puers, and I. De Wolf, "Creep-resistant aluminum alloys for use in MEMS, " J. Micromech. Microeng., vol. 15, pp. 165-170, Jun. 2005.
-
(2005)
J. Micromech. Microeng.
, vol.15
, pp. 165-170
-
-
Modlinski, R.1
Ratchev, P.2
Witvrouw, A.3
Puers, R.4
De Wolf, I.5
-
6
-
-
34547684420
-
The influence of vanadium alloying on the elevatedtemperature mechanical properties of thin gold films
-
Apr.
-
M.-T. Lin, R. R. Chromik, N. Barbosa III, P. El-Deiry, S. Hyun, W. L. Brown, R. P. Vinci, T. J. Delph, "The influence of vanadium alloying on the elevatedtemperature mechanical properties of thin gold films, " Thin Solid Films, vol. 515, pp. 7919-7925, Apr. 2007.
-
(2007)
Thin Solid Films
, vol.515
, pp. 7919-7925
-
-
Lin, M.-T.1
Chromik, R.R.2
Barbosa, N.3
El-Deiry, P.4
Hyun, S.5
Brown, W.L.6
Vinci, R.P.7
Delph, T.J.8
-
7
-
-
78649660781
-
Temperature-dependent viscoelasticity in thin Au films and consequences for MEMS devices
-
Dec.
-
M. McLean, W. L. Brown, and R. P. Vinci, "Temperature-dependent viscoelasticity in thin Au films and consequences for MEMS devices, "J. Microelectromech. Syst., vol. 19, no. 6, pp. 1299-1308, Dec. 2010.
-
(2010)
J. Microelectromech. Syst.
, vol.19
, Issue.6
, pp. 1299-1308
-
-
McLean, M.1
Brown, W.L.2
Vinci, R.P.3
-
8
-
-
67549148361
-
Anelastic stress relaxation in gold films and its impact on restoring forces in MEMS devices
-
Jun.
-
X. Yan, W. L. Brown, Y. Li, J. Papapolymerou, C. Palego, J. C. M. Hwang, and R. P. Vinci, "Anelastic stress relaxation in gold films and its impact on restoring forces in MEMS devices, " J. Microelectromech. Syst., vol. 18, no. 3, pp. 570-576, Jun. 2009.
-
(2009)
J. Microelectromech. Syst.
, vol.18
, Issue.3
, pp. 570-576
-
-
Yan, X.1
Brown, W.L.2
Li, Y.3
Papapolymerou, J.4
Palego, C.5
Hwang, J.C.M.6
Vinci, R.P.7
-
9
-
-
0026140973
-
Hall-Petch relation in nanocrystalline solids
-
T. G. Nieh and J. Wadsworth, "Hall-Petch relation in nanocrystalline solids, " Scripta Metallurgica et Materialia, vol. 25, no. 4, pp. 955-958. 1991.
-
(1991)
Scripta Metallurgica et Materialia
, vol.25
, Issue.4
, pp. 955-958
-
-
Nieh, T.G.1
Wadsworth, J.2
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