Design and analysis of new protection structures for smart power technology with controlled trigger and holding voltage

IEEE International Reliability Physics Symposium Proceedings

Volumn 2001-January, Issue , 2001, Pages 253-258

  De Heyn, V ^a   Groeseneken, G ^a   Keppens, B ^a   Natarajan, M ^a   Vacaresse, L ^b   Gallopyn, G ^b  

^a IMEC   (Belgium)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

Appropriate technology; Automotive applications; Breakdown voltage; Electrostatic discharge; Low voltage; Microelectronics; Power transistors; Protection; Temperature; Voltage control

Indexed keywords

ELECTRIC BREAKDOWN; ELECTROSTATIC DISCHARGE; MICROELECTRONICS; TEMPERATURE; VOLTAGE CONTROL;

APPROPRIATE TECHNOLOGIES; AUTOMOTIVE APPLICATIONS; LOW VOLTAGES; POWER TRANSISTORS; PROTECTION;

ELECTROSTATIC DEVICES;

EID: 84949767329     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2001.922910     Document Type: Conference Paper

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