Pitfalls when correlating TLP, HBM and MM testing

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1998, Pages 170-176

  Notermans, Guido ^a   de Jong, Peter ^a   Kuper, Fred ^a  

^a NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC DISCHARGES; ELECTROSTATICS; MOSFET DEVICES; TRANSMISSION LINE THEORY;

ELECTROSTATIC DISCHARGES (ESD); HUMAN BODY MODEL (HBM) TESTS; MACHINE MODEL (MM) TESTS; TRANSMISSION LINE PULSE (TLP) TESTS;

SEMICONDUCTOR DEVICE TESTING;

EID: 0032312467     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)