Investigations on double-diffused MOS (DMOS) transistors under ESD zap conditions

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1999, Pages 11-18

  Boselli, Gianluca ^a   Meeuwsen, Stan ^a   Mouthaan, Ton ^a   Kuper, Fred ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION IN SOLIDS; ELECTRIC DISCHARGES; ELECTRIC POTENTIAL; ELECTROSTATICS; POWER ELECTRONICS;

DIFFUSE METAL OXIDE SEMICONDUCTOR (DMOS) DEVICES; ELECTROSTATIC DISCHARGES (ESD);

MOSFET DEVICES;

EID: 0033279221     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)