SCOPUS 정보 검색 플랫폼

Beilstein Journal of Nanotechnology

Volumn 6, Issue 1, 2015, Pages 1450-1456

Improved atomic force microscopy cantilever performance by partial reflective coating

(4) Schumacher, Zeno a Miyahara, Yoichi a Aeschimann, Laure b Grütter, Peter a

a MCGILL UNIVERSITY (Canada)

b Nanoworld AG (Switzerland)

Author keywords

Cantilever; Force noise; Partial coating; Q factor

Indexed keywords

NANOCANTILEVERS; Q FACTOR MEASUREMENT; REFLECTION; REFLECTIVE COATINGS;

ATOMIC FORCE MICROSCOPY CANTILEVERS; CANTILEVER; FORCE NOISE; FORCE-DISTANCE CURVES; MECHANICAL QUALITY FACTORS; OPTICAL BEAM DEFLECTION; PARTIAL COATINGS; Q-FACTORS;

ATOMIC FORCE MICROSCOPY;

EID: 84947907559 PISSN: None EISSN: 21904286 Source Type: Journal
DOI: 10.3762/bjnano.6.150 Document Type: Article

Times cited : (12)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.