Conductive Atomic Force Microscopy of Small Magnetic Tunnel Junctions with Interface Anisotropy

IEEE Transactions on Magnetics

Volumn 51, Issue 11, 2015, Pages

  Piotrowski, Stephan K ^a   Bapna, Mukund ^a   Almasi, Hamid ^b   Wang, Wei Gang ^b   Tryputen, Larysa ^c   Ross, Caroline A ^c   Li, Mingen ^d   Chien, Chia Ling ^d   Majetich, Sara A ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b University of Arizona   (United States)

^c Massachusetts Institute of Technology Cambridge   (United States)

^d JOHNS HOPKINS UNIVERSITY   (United States)

Author keywords

Conductive AFM; magnetic tunnel junction; perpendicular magnetic anisotropy; voltage controlled anisotropy

Indexed keywords

ATOMIC FORCE MICROSCOPY; BORON COMPOUNDS; COBALT COMPOUNDS; IRON COMPOUNDS; MAGNETIC ANISOTROPY; MAGNETIC DEVICES; MAGNETIZATION REVERSAL; TUNNELLING MAGNETORESISTANCE;

CONDUCTIVE AFM; CONDUCTIVE ATOMIC FORCE MICROSCOPY; DOMAIN WALL NUCLEATIONS; INTERFACE ANISOTROPY; MAGNETIC TUNNEL JUNCTION; PERPENDICULAR MAGNETIC ANISOTROPY; TUNNELING MAGNETORESISTANCE; VOLTAGE-CONTROLLED;

TUNNEL JUNCTIONS;

EID: 84946236897     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2015.2434798     Document Type: Article

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