Structure, morphology and reducibility of epitaxial cerium oxide ultrathin films and nanostructures

Materials

Volumn 8, Issue 9, 2015, Pages 5818-5833

  Luches, Paola ^a   Valeri, Sergio ^a,b  

^a CNR   (Italy)

^b UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

Author keywords

Interface structure; Low energy electron diffraction; Oxidation state; Reactive molecular beam epitaxy; Reducible oxides; Scanning tunneling microscopy; Strain; Surface morphology; X ray photoelectron spectroscopy

Indexed keywords

CERIUM; ELECTRONS; ENERGY CONVERSION; FILMS; INTERFACE STATES; LOW ENERGY ELECTRON DIFFRACTION; MOLECULAR BEAM EPITAXY; NANOSTRUCTURES; OXIDE FILMS; OXIDES; SCANNING TUNNELING MICROSCOPY; STRAIN; SUBSTRATES; SURFACE MORPHOLOGY; ULTRATHIN FILMS;

COMPUTATIONAL MODEL; EXPERIMENTAL TECHNIQUES; INTERFACE STRUCTURES; OXIDATION STATE; REDUCIBLE OXIDES; SINGLE CRYSTALLINE SUBSTRATES; SPATIAL CONFINEMENT; THEORETICAL STUDY;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84946226138     PISSN: None     EISSN: 19961944     Source Type: Journal    
DOI: 10.3390/ma8095278     Document Type: Review

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