Epitaxial growth of CeO2(111) film on Ru(0001): Scanning tunneling microscopy (STM) and x-ray photoemission spectroscopy (XPS) study

Journal of Chemical Physics

Volumn 140, Issue 4, 2014, Pages

  Hasegawa, Tomo ^a   Shahed, Syed Mohammad Fakruddin ^a   Sainoo, Yasuyuki ^a   Beniya, Atsushi ^b   Isomura, Noritake ^b   Watanabe, Yoshihide ^b   Komeda, Tadahiro ^a,c  

^a TOHOKU UNIVERSITY   (Japan)

^b Rd Management Section   (Japan)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CERIUM OXIDE; EPITAXIAL FILMS; FILM GROWTH; PHOTOELECTRON SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY; X RAYS;

ELEVATED TEMPERATURE; OXYGEN AMBIENT; REDUCTION TEMPERATURES; SCANNING TUNNELING MICROSCOPES; STEP EDGE; SUBSTRATE TEMPERATURE; TEMPERATURE WINDOW; X RAY PHOTOEMISSION SPECTROSCOPY;

SCANNING TUNNELING MICROSCOPY;

EID: 84902128485     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4849595     Document Type: Article

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